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Calibration of AFM Cantilevers (Ref. 7):
"Distortion in the thermal noise spectrum and quality factor of nanomechanical devices due to finite frequency resolution with applications to the atomic force microscope" Review of Scientific Instruments, 82 095104 (2011). PDF (614 kB) Copyright (2011) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. |