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Calibration of AFM Cantilevers (Ref. 8):
"Effect of multiplicative noise on least-squares parameter estimation with applications to the atomic force microscope" Review of Scientific Instruments, 83 055106 (2012). PDF (520 kB) Copyright (2012) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. |