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Static and Dynamic Deflection of AFM Cantilevers (Ref. 5):
"Influence of atomic force microscope cantilever tilt and induced torque on force measurements" Journal of Applied Physics, 103 064513 (2008). PDF (311 kB) Copyright (2008) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. |